Although the atomic-force microscope is a workhorse for nanoscale measurements and manipulations, it’s neither the fastest nor the most informative of instruments. Used widely in biological and materials research, as well as in microelectronics manufacturing and other industries, the instrument provides minute topographical details of a sample but not much else.
NANOPORTRAITS. A single scan by an enhanced atomic-force microscope reveals (clockwise from upper left) the topography, adhesion, elasticity, and softness of a loop of carbon nanotubes Georgia Inst.
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